The latest version of the ISO 10373-6 standard brings for example:

• specific test methods for alternative form factors to the traditional smart card
• EMD (Electro Magnetic Disturbance) characterization
• test of the VHBR technology (Very High Baud Rate). This is a technology allowing transmission of data 8 times faster than traditional smart cards, and 16 times faster than NFC phones.

Philippe Bacle, Micropross president commented: “as a premium test tool designer, it is the duty of Micropross to meet the needs of their most innovative customers with solutions that allow them to make sure that their designs are in conformance with the international standards. Micropross strong involvement in the development of new test standards is well known, and is showcased through contributions during the different normative committees, and continuous collaborative work with the leaders of our industry”

This new test suite is using the cutting edge MP500 TCL3 contactless tester, and the MPManager 3 test platform. The test suite is driving all components of the test setup in order to generate the standardized test conditions, and perform the measurement at the right moment. A clear pass or fail verdict is given to the user, as well as all necessary debug information.

Micropross has worked on those advanced subjects for several years, as shown by the contribution made at an ISO WG8 meeting in Japan with Infineon in September 2010, where we already demonstrated a prototype of VHBR compatible tester. It is therefore obvious that Micropross is able to supply today the market with a stable and reliable solution, already adopted by the leading semi-conductor companies in the market.

The MP500 TCL3 is also able to perform EMVCo L1, NFC Forum and all ISO defined test cases, from both an analog and digital point of view, acting as a card or terminal emulator, making it the most advanced and versatile contactless smart card and NFC dedicated signal generator in the world today.