The European ATM Security Team (EAST) has joined forces with the Latin American Association of Operators Electronic Funds Transfer and Information Services (ATEFI) in order to further strengthen cross border cooperation in combating all types of payment crime including payment card fraud, hi-tech crime and ATM cyber and physical attacks.
The groups first engaged when ATEFI presented at the inaugural EAST Financial Crime and Security Forum (EAST FCS) in The Hague in June 2013 where ATEFI representatives Orlando Garcia, Executive Director, ATEFI (Panama) and Pablo Carretino, Head of Risk & Security, Banelco (Argentina) presented the ‘Fraud Situation in Latin America’.
EAST reciprocated by presenting at the first annual Latin American Forum on Security in Payment Systems in Paraguay last November, hosted by Oscar Castellano, ATEFI. Úna Dillon, EAST Development Director, shared information and data on payment crime activities affecting EAST members in Europe and around the world. The two organisations have been working together since then.
In his statement about the venture, EAST Executive Director, Lachlan Gunn, said: “EAST is pleased to increase its global reach through cooperation with ATEFI, creating a greater network for combating the threats of payment crime. Today, to further strengthen the relationship, the two organisations agreed to mutual Associate Membership in order to facilitate the sharing of information on crimes affecting the payments industry and to help identify global threats.
Over the past 13 years ATM-related payment card fraud has been the major issue faced by all of our EAST National Members. Logical and malware attacks are now recognised as an increasing threat. Our National Members, representing 34 countries with a total of over 1.3 million ATMs, welcome this official working relationship with ATEFI and recognise it is of great strategic importance in battling cross border issues."
Mutual Associate Membership allows EAST and ATEFI to exchange strategic data and other non-operational information.